具体描述
基本信息
书名：集成电路封装材料的表征
定价：98.00元
作者：(美)布伦德尔,(美)埃文斯,(美)摩尔
出版社：哈尔滨工业大学出版社
出版日期：2014-01-01
ISBN：9787560342825
字数：
页码：
版次：1
装帧：平装
开本：16开
商品重量：0.4kg
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内容提要
《集成电路封装材料的表征(英文)》的主要内容包括： Foreword；Preface to the Reissue of the Materials Characterization Series xiii；Preface to Series xiv；Preface to the Reissue of Integrated Circuit Packaging Materials xv；Preface xvi；Contributors xix等。
目录
Foreword xi
Preface to the Reissue of the Materials Characterization Series xiii
Preface to Series xiv
Preface to the Reissue of Integrated Circuit Packaging Materials xv
Preface xvi
Contributors xix
IC PACKAGE RELIABILITY TESTING
MOLD POUND ADHESION AND STRENGTH
MECHANICAL STRESS IN IC PACKAGES
MOISTURE SENSITMTY AND DELAMINATION
THERMAL MANAGEMENT
ELECTRICAL PERFORMANCE OF IC PACKAGES
SOLDERABILITY OF INTEGRATED CIRCUITS
HERMETICITY AND JOINING IN CERAMIC IC PACKAGES
ADVANCED INTERCONNECT TECHNOLOGY
APPENDIX： TECHNIQUE SUMMARIES
作者介绍
Thomas M. Moore and Robert G. McKennaForeword by Walter H. Schroen， TI FELLOWCharacterization of Integrated Circuit Packaging Materials deals with the systemsof materials that prise IC packages. Chapters in this volume address important characteristics of IC packages. It demonstrates analytical techniquesappropriate for IC package characterization through examples of the measurement of critical performance parameters and the analysis of key technologicalproblems of IC packages. This book discusses issues which affect a varietyof package types， including plastic surface—mount packages， hermetic packages， and advanced designs such as flip—chip， chip—on—board， and multi—chipmodels.
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